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연구분야 R&D 이미지
Science of Measurement

Fields of Research

Fields of Research
모집분야, 관련교수진, 연구주제, 연락처, 이메일로 구분하여 안내합니다.
Professors Fields of Research Telephone E-Mail
Il-Bum Kwon Fiber optic sensors, Composite materials, Structural health monitoring 042-868-5326
Jong-Man Lee measurement standards and measurement technologies for radioactivity 042-868-5377
Sang Eon Park atomic physics 042-868-5723
Yonuk Chong Superconducting device, Quantum computer 042-868-5782
Park Seung Nam Photometry, radiometry, radiation thermometry, Photonics, Optical metrology 042-868-5200
Min-Seok Kim Measurement Science and Technology 042-868-5242
Yon-Kyu Park 042-868-5240
Kihm, Hagyong Optical metrology, optomechanical design and analysis, optical system design 042-868-5239
Sejong Chun Liquid Flow Metrology 042-868-5311
Lee, Yun Woo Imaging Optics 042-868-5030
Oh Sang Hyub analytical chemistry, gas analysis 042-868-5341
Wukchul Joung High temperature metal fixed-points, High-speed/precision temperature control, Hydraulic temperature control technique, Isothermal region generation, High speed two-phase heat transfer, Loop heat pipe 042-868-5190
Jung, Jae-Kap High voltage/current metrology 042-862-8103
Lee, Jeongsoon - 042-868-5766
Dalho Kim Chemical metrology, Environmental air, Analytical chemistry 042-868-5356
Hong Seung Soo Vacuum Measurement 042-868-5122
Ghim, Young-Sik multi-layered thin-film thickness profile measurement, freeform surface measurement, computer-controlled optical surfacing for large optics 042-868-5678
Suyong Kwon thermophysical measurement techniques, light scattering techniques, and nanofluids 042-868-5711
JAE-YONG KWON Electromagnetic metrology (RF/Microwave power, Antenna), Computational electromagnetics 042-868-5774
Kyu-Tae Kim Precision Electric Measurement Technology 042-868-5157
Kang Sang-Woo Development of semiconductor process, device and diagnosis system 042-868-5823
Lee Sang Han - 042 868 5812
Yang Ho-Soon Optical testing and fabrication 042-868-5728
Dong-Hoon Lee photometry, radiometry, laser metrology 042-868-5706
PARK JUNGJAE Precision dimensional metrology of semiconductor devices and display panels using broadband source 042-868-5873
Lee Kyoung Beom radionuclide metrology 042-868-5379
Ki Bok Kim Measurement technology using ultrasoic and electromagnetic waves, Sensor technology 042-868-5278
Inseok Yang ThermometryCryogenic ThermometryThermodynamic Temperature Measurements 042-868-5772
Chu-Shik Kang Precision Optical Dimensional Metrology 042-868-5103
Hyu-Sang Kwon (Acoustical imaging, Acoustic array, Signal processing) 042-868-5057
Choi In Mook Pressure metrology/Gravimetry 042-868-5117
Jeong Sik Lim Trace gas analysis using optical frequency comb spectroscopy, Isotope ratio mass spectroscopy, Chemical dynamics of important atmospheric molecules 042-868-5472
Cho, Seung Hyun Design of Magnetostrictive Transducers for Guided Waves and Vibrations 042-868-5752
Wan-Ho Cho Acoustics 042-868-5872
Rhee, Hyug-Gyo Opto-mechatronics, Optical measurement, Optics assembly 042-868-5814
Oh, Jung-Suk Environmental Radioactivity, Decommissioning and Decontamination, Certified Reference Material 042-868-5575
Kim Jin Seog Gas Analysis, Gas Metrology, CRM for Greenhouse Gases, Isotope Ratio Measurement of Gas 042-868-5352
JUNG, JIN SANG Atmospheric analytical chemistry 042-868-5934
Jonghan Jin High-speed 3D Profile Measurement on Semiconductor and Display Manufacturing Process 042-868-5867
Namgoo Kang Gas Environmental Measurement Systems and Data Analysis Science 042-868-5221
Lee Sangil Development of VOC gas standards and aerosol measurement methods 042-868-5864