김영식 교수

Ghim, Young-Sik

INFO

  • 소속캠퍼스한국표준과학연구원
  • 전공 측정과학
  • 연락처042-868-5678
  • 출신전공기계공학과
  • 학위박사
  • 최종출신대학한국과학기술원
  • 이메일

연구분야

다층박막구조물 측정, 자유곡면형상측정, 광학기반의 초정밀 가공기술

Multi-layer Thin-Film Metrology, Free-form Surface Metrology, Optical-based Micro-machining Technology

대표연구실적

-  Young-Sik Ghim, Hyug Rhee, and Angela Davies, "Simultaneous measurements of top surface and its underlying film surfaces in multilayer film structure," Scientific Reports, 2017 -  Manh The Nguyen, Young-Sik Ghim, and Hyug-Gyo Rhee, "Single-shot deflectometry for dynamic 3D surface profile measurements by modified spatial-carrier frquency phase-shifting method, "Scientific Reports, 2019 -  Young-Sik Ghim, Hyug-Gyo Rhee, Angela Davies, Ho-Soon Yang, and Yun-Woo Lee, "3D surface mapping of freeform optics using wavelength scanning lateral shearing interferometry," Opt. Express., 2014

논문(최근 5년)

-  Field-curvature correction according to the curvature of a CMOS image-sensor using air-gap optimization[JOURNAL OF THE OPTICAL SOCIETY OF KOREA,2015-12-25] -  Single-shot deflectometry for dynamic 3D surface profile measurement by modified spatial-carrier frequency phase-shifting method[SCIENTIFIC REPORTS,2019-02-28] -  Process Study of Direct Laser Lithographic System for Fabricating Diffractive Optical Elements with Various Patterns[반도체디스플레이기술학회지,2019-06-28] -  Touch Probe Tip Compensation Using a Novel Transformation Algorithm for Coordinate Measurements of Curved Surfaces[INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING,2019-02-11] -  Optical performance degradation effects by fabrication errors of circular-type computer generated holograms[JOURNAL OF THE KOREAN PHYSICAL SOCIETY,2018-12-01] -  Method of fabricating an array of diffractive optical elements by using a direct laser lithography[INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY,2019-04-10] -  Nonlinearity response correction in phase-shifting deflectometry[MEASUREMENT SCIENCE AND TECHNOLOGY,2018-03-08] -  Simultaneous measurements of top surface and its underlying film surfaces in multilayer film structure[SCIENTIFIC REPORTS,2017-09-19] -  Denoising phase unwrapping algorithm for precise phase shifting interferometry[JOURNAL OF THE KOREAN PHYSICAL SOCIETY,2017-07-01] -  Development of Wavelength Tunable External-Cavity Diode Laser by Considering the Pivot Point Location[Journal of the Korean Society for Precision Engineering,2017-07-01] -  Improved Wavefront Reconstruction Algorithm from Slope Measurements[JOURNAL OF THE KOREAN PHYSICAL SOCIETY,2017-03-01] -  Dual-line fabrication method in direct laser lithography to reduce the manufacturing time of diffractive optics elements[OPTICS EXPRESS,2017-02-06] -  Parametric Study for a Diffraction Optics Fabrication by Using a Direct Laser Lithographic System[Journal of the Korean Society for Precision Engineering,2016-10-03] -  Coma Aberration Correction of Optical System by using a Robot Arm Type Coordinated Measuring Machine[반도체디스플레이기술학회지,2016-09-30] -  Modeling of Various Tool Influence Functions in Computer Controlled Optical Surfacing[Journal of the Korean Society for Precision Engineering,2016-03-01] -  Performance evaluation of MTF peak detection methods by a statistical analysis for phone camera modules[Journal of the Optical Society of Korea,2016-02-29]

특허(최근 5년)

-  듀얼라인 생성이 가능한 레이저 노광법, 노광장치, 그 레이저 노광법을 이용한 듀얼 라인을 갖는 미세패턴 제조방법 및 제조장치[2017-06-30] -  광학계 가공에서의 툴 영향함수 모델링 방법, 그 모델링 방법을 적용한 광학계 가공장치, 가공방법 및 그 기록매체[2017-06-09] -  회전 반사미러를 이용한 파장가변 레이저 공진기 및 그 공진기를 이용한 파장가변 공진방법[2018-01-05] -  복합패턴을 이용한 초고속 편향측정법을 이용한 자유곡면의 3차원 형상측정시스템 및 측정방법[2019-08-21] -  위상천이 편향측정법에서 비선형 응답특성을 보상하기 위한 시스템 및 방법[2019-02-28] -  편광에 따른 각도분해분광간섭영상을 이용한 다층박막 두께 및 굴절률 측정장치 및 측정방법[2019-08-21] -  각도분해 분광반사광측정법을 이용한 다층박막 두께 및 굴절률 측정장치 및 측정방법[2019-01-03] -  영상분광광학계를 이용한 다층막 구조물의 두께와 형상 측정장치 및 측정방법[2018-08-02] -  광학계 연마 자동화 공정을 위한 연마툴 장치 및 그 작동방법[2018-10-24] -  증착장치의 척 가공방법 및 가공장치[2018-10-05] -  위치 보상 알고리즘을 구비한 겐트리 타입의 볼 접촉식 3차원 측정 시스템, 그 작동방법, 그 작동방법이 컴퓨터프로그램 및 기록매체[2019-03-12] -  Correction of rotational inaccuracy in Lateral shearing interfererometry[2018-01-09]