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김영헌 교수

Young Heon KIM

INFO

  • 소속캠퍼스한국표준과학연구원
  • 연락처042-868-5449
  • 출신전공신소재공학
  • 학위박사
  • 최종출신대학한국과학기술원
  • 이메일

연구분야

투과전자현미경학, 재료결정학, 재료과학

Transmission Electron Microscopy, Crystallography, Materials Science

대표연구실적

-  Y.H. Kim*, A. Bhatnagar, E Pippel, M. Alexe, and D. Hesse/Microstructure of highly strained BiFeO3 thin films: Transmission electron microscopy and electron-energy loss spectroscopy studies/J. Appl. Phys/2014. 01. 28 -  Y.C. Park, Y.H. Kim*, H.-H. Nahm, J.-Y. Noh, Y.-S. Kim, J. Kim, W.S. Lee, J.-M. Yang, J. Park/Inversion domain boundaries on tin (Sn)-doped ZnO nanobelts: Aberration-corrected scanning transmission electron microscopy study/Appl. Phys. Lett./2013. 01.21 -  Y.H. Kim*, D.W. Park, S.J. Lee/Gallium-droplet behaviors of self-catalyzed GaAs nanowires: A transmission electron microscopy/Appl. Phys. Lett./2012. 01. 16

논문(최근 5년)

-  Microstructure of highly strained BiFeO3 thin films: Transmission electron microscopy and electron-energy loss spectroscopy studies[2014-01-28] -  Role of domain walls in the abnormal photovoltaic effect in BiFeO3[2013-11-27] -  Microstructural Observations in (Na0.5K0.5)NbO3 Ceramics with CuO and ZnO Additives[2013-03-01] -  Inversion domain boundaries on tin (Sn)-doped ZnO nanobelts: Aberration-corrected scanning transmission electron microscopy study[2013-01-22] -  TEM Observations on 0.65Pb(Zr0.42Ti0.58)O3-0.35Pb(Ni0.33Nb0.67)O3 Ceramics with CuO Additive[2013-01-01] -  Microstructural characteristics of AlN thin layers grown on Si(110) substrates by molecular beam epitaxy: Transmission electron microscopy study[2015-02-02] -  Sub-band level-assisted photoconduction in epitaxial BiFeO3 films[2014-09-22] -  Persistent photoconductivity in strained epitaxial BiFeO3 thin films[2014-08-27] -  Spintronic Functionality of BiFeO3 Domain Walls[2014-11-01]

특허(최근 5년)

-  패턴된 기판을 이용한 다공성 막의 제조 방법 및 그 방법에 의해 제조된 다공성 막 형성 기판[2013-01-30]