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Chu-Shik Kang(Professor)

INFO

  • AffiliationKorea Research Institute of Standards and Science
  • Majors Science of Measurement
  • Contact Information042-868-5103
  • Major물리학
  • DegreePh.D.
  • Highest Level of Education한국과학기술원
  • E-Mail

Field of Research

Precision Optical Dimensional Metrology

Research Results

-  C.-S.Kang et al., "MEASUREMENT OF THE DIAMETER VARIATION AND REFRACTIVE INDEX INHOMOGENEITY OF A FUSED SILICA SPHERE USING FOURSURFACE PHASE-SHIFTING INTERFEROMETRY", XX IMEKO World Congress, 2012. -  J.-A. Kim et al., "Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry", Opt. Express, 2014 -  C.-S.Kang et al., "High speed phase shifting interferometry using injection locking of the laser frequency to the resonant modes of a confocal Fabry-Perot cavity", Opt. Express, 2009.

Treatise

-  Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry[OPTICS EXPRESS,2014-03-12] -  Quadrature laser interferometer for in-line thickness measurement of glass panels using a current modulation technique[APPLIED OPTICS,2014-07-10] -  An optical straightness measurement sensor for the KRISS watt balance[ MEASUREMENT,2015-02-02] -  A phase-encoding method for absolute position measurement using a single track binary code scale[Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015,2015-06-01] -  High-speed interferometric thickness measurement of transparent plate and film using a current modulation technique[Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015,2015-06-01] -  High-Speed Double-Slit Interferometer using a Position Sensitive Detector for In-Line Thickness Variation Measurement of Glass Panels[International Journal of Precision Engineering and Manufacturing,2015-08-01] -  Absolute angle measurement using a phase-encoded binary graduated disk[ MEASUREMENT,2016-02-15] -  Report on APMP key comparison: calibration of angle standards[Metrologia,2016-09-23] -  An interferometric system for measuring thickness of parallel glass plates without 2pi ambiguity using phase analysis of Haidinger fringes[ REVIEW OF SCIENTIFIC INSTRUMENTS,2017-05-01]

Patent

-  광섬유 페룰 공진기를 이용한 스펙트럼 영역 간섭 장치 및 스펙트럼 영역 간섭 방법[2014-10-08] -  FBG를 이용한 스펙트럼 영역 간섭 장치 및 스펙트럼 영역 간섭 방법[2014-10-24] -  투명 기판 모니터링 장치 및 투명 기판 측정 방법[2015-01-20] -  유체 렌즈를 이용한 다층 구조 측정 장치 및 그 측정 방법[2015-06-30] -  광섬유를 이용한 미세 패턴의 선폭 및 깊이 동시 측정 장치 및 방법[2015-06-30] -  두께 측정 장치 및 두께 측정 방법[2015-08-10] -  기하학적 두께와 굴절률 측정을 위한 투과형 광섬유 간섭 장치[2015-08-10] -  두께 측정 장치[2015-09-14] -  기하학적 두께와 굴절률 측정을 위한 반사형 광섬유 간섭 장치[2015-10-30]