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Lee, Yun Woo(Professor)

INFO

  • AffiliationKorea Research Institute of Standards and Science
  • Majors Science of Measurement
  • Contact Information042-868-5030
  • Major물리학
  • DegreePh.D.
  • Highest Level of Education한국과학기술원
  • E-Mail

Field of Research

Imaging Optics

Research Results

-  H. G. Rhee, Y. S. Ghim, J. Y. Lee, H. S. Yang, Y. W. Lee, "Correction of rotational inaccuracy in lateral shearing interferometery for freeform measurement", Optics Express, 21(21), 24799-24808(2013). -  H. G. Rhee, Y. S. Ghim, Y. W. Lee, "Stabilized two-dimensional linewidth enhancement in direct laser lithography", Precision Engeering, 37, 812-816(2013). -  Y. S. Ghim, H. G. Rhee, H. S. Yang, Y. W. Lee, "thin-film thickness profile measurement using a Mirau-type low-coherence interferometer", Measurement Science & Technology, 24(075002), 1-7(2013).

Treatise

-  Pixel-based absolute test of 1 m lightweight mirror for a space telescope[ JOURNAL OF THE KOREAN PHYSICAL SOCIETY,2014-11-14] -  Bipod flexure for 1 m primary mirror system[ REVIEW OF SCIENTIFIC INSTRUMENTS,2014-12-01] -  Field-curvature correction according to the curvature of a CMOS image sensor using air-gap optimization[JOURNAL OF THE OPTICAL SOCIETY OF KOREA,2015-12-25] -  Performance evaluation of MTF peak detection methods by a statistical analysis for phone camera modules[JOURNAL OF THE OPTICAL SOCIETY OF KOREA,2016-02-29]

Patent

-  래이저 주사 방식에서 편광 간섭무늬방향의 변환이 가능한 미세 패턴제조장치 및 그 제조장치를 이용한 미세패턴 제조방법[2015-12-29]