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Ghim, Young-Sik(Professor)

INFO

  • AffiliationKorea Research Institute of Standards and Science
  • Majors Science of Measurement
  • Contact Information042-868-5678
  • Major기계공학과
  • DegreePh.D.
  • Highest Level of Education한국과학기술원
  • E-Mail

Field of Research

multi-layered thin-film thickness profile measurement, freeform surface measurement, computer-controlled optical surfacing for large optics

Research Results

-  Young-Sik Ghim and Seung-Woo Kim,"Fast, precise, tomographic measurements of thin films," Appl. Phys. Lett., 2007 -  Young-Sik Ghim, Amit Suratkar, and Angela Davies," Reflectometry-based wavelength scanning interferometry for thickness measurements of very thin wafers," Opt. Express., 2010 -  Young-Sik Ghim, Hyug-Gyo Rhee, Angela Davies, Ho-Soon Yang, and Yun-Woo Lee, "3D surface mapping of freeform optics using wavelength scanning lateral shearing interferometry," Opt. Express., 2014

Treatise

-  Coma aberration correction of optical system by using a robot arm type coordinated measuring machine[반도체디스플레이기술학회지,2016-09-30] -  Parametric study for a diffraction optics fabrication by using a direct laser lithographic system[한국정밀공학회지,2016-10-01] -  Field-curvature correction according to the curvature of a CMOS image-sensor using air-gap optimization[JOURNAL OF THE OPTICAL SOCIETY OF KOREA,2015-12-25] -  Performance evaluation of MTF peak detection methods by a statiscal analysis for phone camera modules[JOURNAL OF THE OPTICAL SOCIETY OF KOREA,2016-02-29] -  Modeling of various tool influence functions in computer controlled optical surfacing[한국정밀공학회지,2016-03-01] -  Modeling of edge tool influence functions for computer controlled optical surfacing process[INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY,2015-08-02] -  Pixel-based absolute test of a 1-m lightweight mirror for a space telescope[ JOURNAL OF THE KOREAN PHYSICAL SOCIETY,2014-11-14] -  Accuracy Improvement and Systematic Bias Analysis of Scanning White Light Interferometry for Free-form Surfaces Measurements[한국정밀공학회지,2014-07-01] -  Wavelength Scanning Lateral Shearing Interferometer for Freeform Surface Measurement[한국정밀공학회지,2014-03-01]

Patent

-  파장주사 층밀리기 간섭계를 이용한 자유곡면의 삼차원 형상 측정 장치[2015-09-14] -  1차 미분 측정기의 동작 방법[2015-09-07] -  이중 광빗 펨토초 광섬유 레이저[2015-03-05] -  삼차원 박막 두께 형상 측정 방법[2015-01-20] -  형상 측정 장치 및 형상 측정 방법[2014-12-10] -  광경화성 수지를 이용한 위상격자 하이브리드 렌즈 광경화성수지를 이용한 위상격자 하이브리드 렌즈 제조방법[2014-04-21] -  직접레이저 노광법을 이용한 위상회절소자 제조장치 위상회절소자 제조방법 및 직접레이저 노광법을 이용한 위상회절소자[2014-04-21]